Open Access
Subscription Access
Table of Contents
Foreword
| FOREWORD |
PDF
|
| Shigeru UMEMURA | 1177-1177 |
| FOREWORD |
PDF
|
| Yoshio MITA | 1313-1314 |
Letters
| An Integrated Calculation Method to Predict Arc Behavior |
PDF
|
| Xingwen LI, Degui CHEN | 1228-1229 |
| The Relationship between Voltage and Duration of Short-Time Arc Generated by Slowly Breaking Silver Contact |
PDF
|
| Yoshiki KAYANO, Hikaru MIURA, Kazuaki MIYANAGA, Hiroshi INOUE | 1230-1232 |
| Quadrature Hartley VCO and Injection-Locked Frequency Divider |
PDF
|
| Sheng-Lyang JANG, Chia-Wei CHANG, Sheng-Chien WU, Chien-Feng LEE, Lin-yen TSAI, Jhin-Fang HUANG | 1371-1374 |
| Design of a 0.5 V Op-Amp Based on CMOS Inverter Using Floating Voltage Sources |
PDF
|
| Jun WANG, Tuck-Yang LEE, Dong-Gyou KIM, Toshimasa MATSUOKA, Kenji TANIGUCHI | 1375-1378 |
| Compact Double-Gate Metal-Oxide-Semiconductor Field Effect Transistor Model for Device/Circuit Optimization |
PDF
|
| Norio SADACHIKA, Takahiro MURAKAMI, Hideki OKA, Ryou TANABE, Hans Juergen MATTAUSCH, Mitiko MIURA- MATTAUSCH | 1379-1381 |
Papers
| Contact Resistance Characteristics of Improved Conductive Elastomer Contacts for Contaminated Printed Circuit Board in SO2 Environment |
PDF
|
| Terutaka TAMAI, Yasushi SAITOH, Yasuhiro HATTORI, Hirosaka IKEDA | 1192-1198 |
| Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness |
PDF
|
| Tetsuya ITO, Shigeru SAWADA, Yasuhiro HATTORI, Yasushi SAITOH, Terutaka TAMAI, Kazuo IIDA | 1199-1205 |
| Breaking Contact Phenomena of a Time-coordinated Non-arcing Relay |
PDF
|
| Noboru WAKATSUKI, Hiroshi HONMA | 1206-1210 |
| A Study on Contact Spots of Earthquake Disaster Prevention Relays |
PDF
|
| Yoshitada WATANABE, Yuichi HIRAKAWA | 1211-1214 |
| 3-D Finite Element Analysis of Dynamic Characteristics of Twin-Type Relay Interfered by Uniform Constant Magnetic Field |
PDF
|
| Guofu ZHAI, Wenying YANG, Xue ZHOU | 1215-1221 |
| Research on Effect of Ferromagnetic Material on the Critical Current of Bi-2223 Tape |
PDF
|
| Yi WU, Mingzhe RONG, Jian LI, Xiaohua WANG | 1222-1227 |
| Study on Arc Generated by Opening Electromagnetic Relay Contacts in DC Low-Current Resistive Circuit with Constant Velocity |
PDF
|
| Guofu ZHAI, Xue ZHOU | 1233-1239 |
| Simulation and Experimental Study of Arc Motion in a Low-Voltage Circuit Breaker Considering Wall Ablation |
PDF
|
| Qiang MA, Mingzhe RONG, Anthony B. MURPHY, Yi WU, Tiejun XU, Fei YANG | 1240-1248 |
| Relationship between Arc Duration and Motion of Arc Spots for Break Arcs of Ag and Ag/ZnO Electrical Contacts |
PDF
|
| Junya SEKIKAWA, Takumi SUGIO, Takayoshi KUBONO | 1249-1254 |
| Motion of Break Arcs Driven by External Magnetic Field in a DC42 V Resistive Circuit |
PDF
|
| Junya SEKIKAWA, Takayoshi KUBONO | 1255-1260 |
| Effect of Back-Volume of Arc-Quenching Chamber on Arc Behavior |
PDF
|
| Ruicheng DAI, Degui CHEN, Xingwen LI, Chunping NIU, Weixiong TONG, Honggang XIANG | 1261-1267 |
| Time-Resolved Spectroscopic Temperature Measurement of Break Arcs in a D.C.42 V Resistive Circuit |
PDF
|
| Junya SEKIKAWA, Naoki MORIYAMA, Takayoshi KUBONO | 1268-1272 |
| Analysis and Optimization for a Contactor with Feedback Controlled Magnet System |
PDF
|
| Yingyi LIU, Degui CHEN, Chunping NIU, Liang JI, Weixiong TONG | 1273-1279 |
| Analysis and Optimization for the Operating Mechanism of Air Circuit Breaker |
PDF
|
| Degui CHEN, Liang JI, Yunfeng WANG, Yingyi LIU | 1280-1285 |
| Thermal Analysis of AC Contactor Using Thermal Network Finite Difference Analysis Method |
PDF
|
| Chunping NIU, Degui CHEN, Xingwen LI, Yingsan GENG | 1286-1291 |
| A New Method to Evaluate the Short-Time Withstand Current for Air Circuit Breaker |
PDF
|
| Honggang XIANG, Degui CHEN, Xingwen LI, Weixiong TONG | 1292-1298 |
| Research on Mechanical Fault Prediction Algorithm for Circuit Breaker Based on Sliding Time Window and ANN |
PDF
|
| Xiaohua WANG, Mingzhe RONG, Juan QIU, Dingxin LIU, Biao SU, Yi WU | 1299-1305 |
| Fundamental Measurement of Electromagnetic Field Radiated from a Coaxial Transmission Line Caused by Connector Contact Failure |
PDF
|
| Yu-ichi HAYASHI, Hideaki SONE | 1306-1312 |
| Low-Capacitance and Fast Turn-on SCR for RF ESD Protection |
PDF
|
| Chun-Yu LIN, Ming-Dou KER, Guo-Xuan MENG | 1321-1330 |
| A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs |
PDF
|
| Toshihiro MATSUDA, Yuya SUGIYAMA, Keita NOHARA, Kazuhiro MORITA, Hideyuki IWATA, Takashi OHZONE, Takayuki MORISHITA, Kiyotaka KOMOKU | 1331-1337 |
| A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology |
PDF
|
| Masako FUJII, Koji NII, Hiroshi MAKINO, Shigeki OHBAYASHI, Motoshige IGARASHI, Takeshi KAWAMURA, Miho YOKOTA, Nobuhiro TSUDA, Tomoaki YOSHIZAWA, Toshikazu TSUTSUI, Naohiko TAKESHITA, Naofumi MURATA, Tomohiro TANAKA, Takanari FUJIWARA, Kyoko ASAHINA, Masakazu OKADA, Kazuo TOMITA, Masahiko TAKEUCHI, Shigehisa YAMAMOTO, Hiromitsu SUGIMOTO, Hirofumi SHINOHARA | 1338-1347 |
| Adaptive Impedance Matching System Using FPGA Processor for Efficient Control Algorithm |
PDF
|
| Hirokazu OBA, Minseok KIM, Ryotaro TAMAKI, Hiroyuki ARAI | 1348-1355 |
| A CMOS Low Dropout Regulator with Extended Stable Region for the Effective Series Resistance of the Output Capacitor |
PDF
|
| Hsuan- I PAN, Chern-Lin CHEN | 1356-1364 |
| A Single Input Change Test Pattern Generator for Sequential Circuits |
PDF
|
| Feng LIANG, ShaoChong LEI, ZhiBiao SHAO | 1365-1370 |
Invited Papers
| High Speed Electronic Connector Design: A Review of Electrical and Electromagnetic Properties of Passive Contact Elements -- Part 1 |
PDF
|
| Roland S. TIMSIT | 1178-1191 |
| Leakage Current and Floating Gate Capacitor Matching Test |
PDF
|
| Weidong TIAN, Joe R. TROGOLO, Bob TODD | 1315-1320 |